Coupled Degradation Behavior in a Monolithically Integrated GaN Power Chip Under Load Dump Stress

Huangtao Zeng, Chao Yang, Zhiyuan He, Yijun Shi, Liang He, G. Lu, Yuan Chen, Xinghuan Chen 等 10 位

Guangdong University of Technology　China Electronic Product Reliability and Environmental Test Institute　University of Electronic Science and Technology of China　China Resources (China)