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Investigation of cell–substrate interactions by focused ion beam preparation and scanning electron microscopy
Andrea Friedmann, Andreas Hoess, Andreas Cismak, Andreas M. F. Heilmann
Fraunhofer Institute for Mechanics of Materials
来源Acta Biomaterialia
年份2011
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参考文献 46
Introduction to focused ion beams : instrumentation, theory, techniques, and practice
被引 596Lucille A. Giannuzzi, Fred A. Stevie · CERN Document Server (European Organization for Nuclear Research) · 2005
Serial Section Scanning Electron Microscopy of Adult Brain Tissue Using Focused Ion Beam Milling
被引 740Graham William Knott, Herschel M. Marchman, David Wall · Journal of Neuroscience · 2008
Preparation of transmission electron microscopy cross-section specimens using focused ion beam milling
被引 255Richard M Langford, Amanda K. Petford-Long · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2001
此处列出前 3 条
引用本文 49
Characterization of the Cell–Nanopillar Interface by Transmission Electron Microscopy
被引 214Lindsey Hanson, Ziliang Carter Lin, Chong Xie · Nano Letters · 2012
Interfacing Cells with Vertical Nanoscale Devices: Applications and Characterization
被引 87Allister F. McGuire, Francesca Santoro, Bianxiao Cui · Annual Review of Analytical Chemistry · 2018
Nanoporous Aluminium Oxide Membranes as Cell Interfaces
被引 84Dorothea Brüggemann · Journal of Nanomaterials · 2013
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