研究论文
Cu based electrically programmable fuse characteristics for CMOS technology
Honggyun Kim, Honggyun Kim, Jamal Aziz, Vijay D. Chavan, Deok-kee Kim
Sejong University
来源Current Applied Physics
年份2023
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学科主题
工程Semiconductor materials and devices
Physical Unclonable Functions (PUFs) and Hardware Security · Advanced Memory and Neural Computing
参考文献 29
Mass transport equations unifying descriptions of isothermal diffusion, thermomigration, segregation, and position-dependent diffusivity
被引 33T. Y. Tan · Applied Physics Letters · 1998
An investigation of electrical current induced phase transformations in the NiPtSi/polysilicon system
被引 13Deok‐kee Kim, A. Domenicucci, Subramanian S. Iyer · Journal of Applied Physics · 2008
Failure Mechanisms of W/TiN/Ti Metal Lines under High Current Stressing
被引 2Deok‐kee Kim, Soo-Jung Hwang, Young‐Chang Joo · Applied Physics Express · 2012
此处列出前 3 条
施引文献 4
Controlled charge transport in ZrO2 and its bilayer structures for low-power memory
被引 13Jamal Aziz, Muhammad Farooq Khan, Daniel Neumaier · Journal of Alloys and Compounds · 2024
Recent progress and challenges of photosensitive polyimides in advanced packaging: Technology beyond limit
被引 10Laraib Sajjad, Ruhan E. Ustad, Vijay D. Chavan · European Polymer Journal · 2025
Normally closed thermally activated irreversible solid state erbium hydrides switches
被引 1Michael J. Abere, Richard J. Gallegos, Matthew W. Moorman · Micro and Nano Engineering · 2024
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