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Methods for probing charging properties of polymeric materials using XPS
Hikmet Sezen, Gülay Ertaş, Şefik Süzer
Bilkent University
来源Journal of Electron Spectroscopy and Related Phenomena
年份2009
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材料 / 化学Electron and X-Ray Spectroscopy Techniques
Semiconductor materials and devices · Analytical Chemistry and Sensors
参考文献 46
High Resolution XPS of Organic Polymers: The Scienta ESCA300 Database
被引 2,016G. Beamson, Dayrl P. Briggs · Medical Entomology and Zoology · 1992
Characterizing carrier-trapping phenomena in ultrathin SiO2 films by using the x-ray photoelectron spectroscopy time-dependent measurements
被引 26Yoshiya Hagimoto, Hiroshi Fujioka, M. Oshima · Applied Physics Letters · 2000
Characterization of SiO2/Si interfaces by using X-ray photoelectron spectroscopy time-dependent measurement
被引 27Kazuyuki Hirose, Kouhei Sakano, Kazutoshi Takahashi · Surface Science · 2002
此处列出前 3 条
引用本文 17
XPS for chemical- and charge-sensitive analyses
被引 55Hikmet Sezen, Şefik Süzer · Thin Solid Films · 2013
Transient surface photovoltage in n- and p-GaN as probed by x-ray photoelectron spectroscopy
被引 40Hikmet Sezen, Ekmel Özbay, Özgür Aktaş · Applied Physics Letters · 2011
Au nanoparticles in PMMA matrix: In situ synthesis and the effect of Au nanoparticles on PMMA conductivity
被引 26Eda Yılmaz, Şefik Süzer · Applied Surface Science · 2010
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