Understanding the deformation creep and role of intermetallic compound-microstructure in Sn-Ag-Cu solders

Tin-based alloys are commonly used in lead-free solder joints in electronic interconnection applications, where creep can limit joint reliability. In this work, directionally solidified bulk solder alloys of different compositions (pure tin, SAC105 and SAC305) are mechanically tested under a constant load for each composition at room temperature to understand mechanical creep performance and quantify the role of different content of Ag 3 Sn and Cu 6 Sn 5 intermetallic compounds (IMCs) in terms of secondary creep strain rate, microstructural evolution , and total amount of accumulated strain. In this work, microstructures are fabricated using directional solidification to promote a systematic variation in IMC sizes, shapes, and distributions within similar crystal orientations of the primary β-Sn matrix. Analysis of creep data indicates that secondary creep is dominated by obstacle-controlled dislocation motion . This is further confirmed by electron backscatter diffraction (EBSD) analysis, which reveals that the formation of subgrains and internal structure, correlating to the initial microstructure of the sample, i.e. changes in secondary dendrite arm spacing (λ 2 ) and eutectic intermetallic spacing (λ e ). The experimental observations are supported further by crystal plasticity simulations that explicitly model the presence of IMCs within the Sn-based samples and show the dependence of the secondary creep rate upon the IMC content, and therefore be beneficial for the possible future composition design in solders.