MeaSSUre:I-V: Open software for transistor characterization using source-meter units

Despite the importance of transistors in modern electronics, transistor characterization requires expensive instruments that are not affordable for many researchers, engineers and educators. Here, we present software that can control source-meter units (SMUs) for current–voltage (I–V) characterization of field-effect transistors, bipolar junction transistors and general two-terminal devices. The software provides a graphical user interface that allows the user to perform parameter setup, real-time data plotting and data management with ease. By simultaneously controlling multiple SMUs with user-friendly interfaces, the developed software provides a more affordable option for the characterization of basic electrical elements, which can benefit research and educational activities related to electronics.