Nanometre-precision terahertz interferometry for battery electrode metrology
Guseon Kang, Jaeyoon Kim, 김미리, Y. H. Lee, Dong-Chel Shin, Jinwoo Jeon, Hyeonwoo Kim, Dae Hee Kim 等 11 位
Korea Advanced Institute of Science and Technology Korea Institute of Industrial Technology Chungnam National University Seoul National University of Science and Technology
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High-precision, non-destructive thickness measurement is essential for lithium-ion battery (LIB) manufacturing. Existing approaches, such as X-rays, acoustic waves, and optical lasers, are limited by speed, resolution, or penetration into conductive materials. Here, we demonstrate nanometre-precision thickness measurements of LIB electrodes using terahertz (THz) Fabry-Pérot (FP) interferometry referenced to a photonic frequency comb. Combining the comb's SI-traceable frequency accuracy with THz radiation's immunity to scattering and absorption, our system directly detects FP modes with sub-10 MHz precision at sweep rates exceeding 12 THz/s, while spectral analysis simultaneously yields the complex refractive index. Electrode thicknesses of 50-150 μm are measured with nanometre precision: 70.1 nm (anode) and 465.5 nm (cathode) at 0.2 s, improving to 7.8 nm and 25.2 nm at 25.6 s, representing a one-to-two orders of magnitude improvement over temporal-analysis methods. The system further supports 3D profiling and dynamic thickness monitoring, enabling a unified, calibration-free platform for next-generation LIB metrology.
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