Mitigation of dielectric heating in surface-electrode ion traps

Ions in surface-electrode ion traps are susceptible to heating due to various noise sources, which can degrade coherence and fidelity. This study investigates the heating mechanisms in surface-electrode ion traps, with a focus on the role of dielectric materials and the effectiveness of shielding techniques. Using the fluctuation-dissipation theorem and finite element simulations, we demonstrate that a metallic shielding layer beneath the dielectric layer can reduce the heating rate by five orders of magnitude. Additionally, indenting the dielectric layer supporting the electrodes further decreases the heating rate by minimizing the exposed area in the ion’s field of view. Experimental results validate these findings, showing a three-order-of-magnitude reduction in heating rates for traps with a shielding layer. Our work provides a comprehensive methodology for assessing and minimizing dielectric heating, offering practical design insights for improving the performance of trapped ion quantum systems.