Resolving the blueshift in calculations of the EUV spectrum of multiply charged tin ions
Marten L. Reitsma, John Sheil, O. O. Versolato, E. Kahl, J. C. Berengut
Advanced Research Center for Nanolithography (Netherlands) Vrije Universiteit Amsterdam Pawsey Supercomputing Research Centre UNSW Sydney
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We report relativistic calculations on the complex open shell Sn 12 + highly charged ion, a prototypical plasma ion relevant for extreme ultraviolet (EUV) nanolithography. Previous calculations of EUV emissivity in tin plasmas consistently generate a spectrum in which the region of peak emissivity is blueshifted relative to experiment. By optimizing our numerical methods to take full advantage of modern, high-performance CPU architectures, we are able to completely saturate the configuration interaction within the n = 4 shell. Coupled with a thorough treatment of core-valence correlation we resolve the blueshift, finding a surprisingly large influence of highly excited states on the spectrum that is dominated by multiply excited states.
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Advanced Chemical Physics Studies · X-ray Spectroscopy and Fluorescence Analysis
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