Electrostatic discharge in semiconductor devices: an overview
J.E. Vinson, Juin J. Liou
ON Semiconductor (United States) University of Central Florida
阅读操作
确认中在文库中上传 PDF 后可生成中文音频讲解。
摘要与影响
Electrostatic discharge (ESD) is an event that sends current through an integrated circuit (IC). This paper reviews the impact of ESD on the IC industry and details the four stages of an ESD event: (1) charge generation, (2) charge transfer, (3) device response, and (4) device failure. Topics reviewed are charge generation mechanisms, models for ESD charge transfer, electrical conduction mechanisms, and device damage mechanisms leading to circuit failure.
逐年被引趋势
关键指标
同类平均 = 1
同领域 · 同年份 · 同类型
Google Scholar 与 OpenAlex 的被引统计范围不同，数值存在差异属正常。
AI 辅助阅读
依据：摘要
可就本文提问；依据不足时会说明。
学术脉络
学科主题
工程Electrostatic Discharge in Electronics
Integrated Circuits and Semiconductor Failure Analysis · Physical Unclonable Functions (PUFs) and Hardware Security
参考文献 58
此处列出前 3 条
引用本文 155
按被引量排序，此处列出前 3 条