A Review on IGBT Module Failure Modes and Lifetime Testing
Ahmed Abuelnaga, Mehdi Narimani, Amir Sajjad Bahman
McMaster University Aalborg University
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摘要与影响
This article focuses on failure modes and lifetime testing of IGBT modules being one of the most vulnerable components in power electronic converters. IGBT modules have already located themselves in the heart of many critical applications, such as automotive, aerospace, transportation, and energy. They are required to work under harsh operational and environmental conditions for extended target lifetime that may reach 30 to 40 years in some applications. Therefore, addressing the reliability of IGBT modules is of paramount importance. The paper provides a comprehensive review on IGBT modules dominant failure modes, and long-term reliability. A detailed discussion on accelerated testing, and lifetime and degradation characterization considering thermo-mechanical stress is also presented in details.
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工程Silicon Carbide Semiconductor Technologies
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