A Highly Reliable Digital Trimming Module Based on eFUSE
Hongye Zhou, Xiaobo Zhang, Bo Li
North China University of Technology
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摘要与影响
As CMOS process nodes continue to shrink, the impact of process variations on integrated circuit performance becomes increasingly significant, making electronic fuse (eFUSE) trimming technology a core means of ensuring parameter consistency and yield. This paper presents a highly reliable digital trimming module based on eFUSE, designed to address issues such as high static power consumption in conventional trimming circuits and insufficient accuracy in fuse state readout. The proposed module incorporates a sense amplifier to enhance the accuracy of fuse state identification, and employs digital code inputs to enable adjustment of the critical resistance for fuse identification and precise blow control for designated fuses. By integrating this module into a bandgap voltage reference circuit, precise calibration of the reference voltage is achieved using a 3-bit digital trimming code, thereby validating the functional integrity and operational reliability of the module. This design offers an effective hardware solution for parameter calibration in analog integrated circuits. The module supports multi-bit trimming code expansion and can be flexibly integrated into various analog circuit systems.
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工程Analog and Mixed-Signal Circuit Design
VLSI and Analog Circuit Testing · Low-power high-performance VLSI design