2 kV, 0.7 mΩ•cm2 Vertical Ga2O3 Superjunction Schottky Rectifier with Dynamic Robustness
Yuan Qin, Matthew Porter, Ming Xiao, Zhonghao Du, Hongming Zhang, Yunwei Ma, Joseph A. Spencer, Boyan Wang 等 17 位
Virginia Tech University of Southern California United States Naval Research Laboratory Novel Crystal Technology, Inc. (Japan)
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摘要与影响
We report the first experimental demonstration of a vertical superjunction device in ultra-wide bandgap (UWBG) Ga2O3. The device features 1.8 μm wide, 2×1017cm-3doped n-Ga2O3pillars wrapped by the charge-balanced p-type nickel oxide (NiO). The sidewall NiO is sputtered through a novel self-align process. Benefited from the high doping in Ga2O3, the superjunction Schottky barrier diode (SJ-SBD) achieves a ultra-low specific on-resistance (RON,SP) of 0.7 mΩ•cm2with a low turn-on voltage of 1 V and high breakdown voltage (BV) of 2000 V. The RON,SP~BV trade-off is among the best in all WBG and UWBG power SBDs. The device also shows good thermal stability with BV > 1.8 kV at 175 °C. In the unclamped inductive switching tests, the device shows a dynamic BV of 2.2 kV and no degradation under 1.7 kV repetitive switching, verifying the fast acceptor depletion in NiO under dynamic switching. Such high-temperature and switching robustness are reported for the first time in a heterogeneous superjunction. These results show the great potential of UWBG superjunction power devices.
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材料 / 化学Ga2O3 and related materials
GaN-based semiconductor devices and materials · Silicon Carbide Semiconductor Technologies
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