Modeling and minimizing the inductance of bond wire interconnects
Ivan Ndip, Abdurrahman Öz, Stephan Guttowski, H. Reichl, Klaus‐Dieter Lang, Heino Henke
Fraunhofer Institute for Reliability and Microintegration
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摘要与影响
In this paper, a novel analytical model for calculating the partial self-inductance of bond wires in dependent on bonding parameters such as loop height, distance between bonding positions and the thickness of the metallization on which the wire is bonded, is derived for the first time. An excellent correlation is obtained between inductances extracted using our proposed model and those extracted using Ansys Q3D, with a maximum deviation of approximately 1%. Furthermore, methods for minimizing the inductance of bond wires, based on the definitions of loop and partial inductances are discussed. Test bond wire structures are designed, fabricated and measured to quantify the implemented method.
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工程3D IC and TSV technologies
Electronic Packaging and Soldering Technologies · Electromagnetic Compatibility and Noise Suppression
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