Thermally Annealed Iron (Oxide) Thin Film on an Alumina Barrier Layer, by XPS
Nitesh Madaan, Supriya S. Kanyal, David S. Jensen, Michael A. Vail, Andrew E. Dadson, Mark Engelhard, Matthew R. Linford
Brigham Young University Pacific Northwest National Laboratory Environmental Molecular Sciences Laboratory
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Herein we show characterization of an Fe thin film on Al2O3 after thermal annealing under H2 using AlKα x-rays. The XPS survey spectrum, Fe 2p and O 1s narrow scans, and valence band regions are presented. The survey spectrum shows aluminum signals due to exposure of the underlying Al2O3 film during Fe nanoparticle formation.
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材料 / 化学Electron and X-Ray Spectroscopy Techniques
X-ray Spectroscopy and Fluorescence Analysis · Iron oxide chemistry and applications