量子系统辨识与参数估计

The rapid development of quantum information poses demands for robust and high-precision control of quantum systems, while quantum system identification and parameter estimation are fundamentally important for quantum control. In this paper, we provide a survey on the direction of quantum system identification and parameter estimation, with emphasis on the four branches including quantum metrology, quantum tomography, quantum filtering, and quantum noise spectroscopy. The 问题 formulation, analysis tools, solutions, and various applications are introduced.