Generating flat-top beams with extended depth of focus
Vishwa Pal, Chene Tradonsky, Ronen Chriki, Natan Kaplan, Alexander Brodsky, Mickael Attia, Nir Davidson, Asher A. Friesem
Weizmann Institute of Science
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Two approaches for generating flat-top beams (uniform intensity profile) with extended depth of focus are presented. One involves two diffractive optical elements (DOEs) and the other only a single DOE. The results indicate that the depth of focus of such beams strongly depends on the phase distribution at the output of the DOEs. By having uniform phase distribution, it is possible to generate flat-top beams with extended depth of focus.
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