Integrated optical rotation detection scheme for chip-scale atomic magnetometer empowered by silicon-rich SiNx metalens

High-performance atomic magnetometers (AMs) rely on the measurement of optical rotation, which requires a set of bulky polarization optics that limit their applications in scenarios where portability and compactness are necessary. In this study, a miniaturized AM is constructed based on a cubic 87 Rb vapor cell and monolithic metalens, which provides an integrated scheme to achieve optical rotation detection induced by the circular birefringence of polarized atoms. The designed metalens achieves polarization splitting with deflection angles of ±10 ∘ and focusing with efficiencies of approximately 30% for orthogonal linear polarizations. The sensitivity of our compact device is ∼30 fT/Hz 1/2 with a dynamic range of around ±1.45 nT. We envision that the presented approach paves the way for the chip integration of emerging atomic devices, which are in demand for applications such as biomagnetic imaging and portable atomic gyroscopes.