Reliability analysis of Multi-Layer Ceramic Capacitors based on BaTiO3 and their Mechanism of Insulation resistance degradation

The demand for high performance multilayer ceramic capacitors (MLCCs) has rapidly increased keeping up with the recent trends in electronics seeking better performance per volume. It follows that thinning of dielectric layers of MLCC and atomization of powders have become two most challenging issues these days. However, it is well known that these two approaches are not free from reliability issues. In this brief review, we introduce the commonly accepted models that explain how dielectric materials fail during operation and how to evaluate the lifetime of MLCCs with a real world example.