Analysis of Discharge Failure Mechanism of IGBT Power Modules
Lu Xu, Kaixuan Li, Ziyue Yang, Xinyu Jiang
Xi'an University of Technology Xi'an Jiaotong University
阅读操作
确认中在文库中上传 PDF 后可生成中文音频讲解。
摘要与影响
IGBT power modules are usually used as circuit-breaking components in power systems, and are widely used in solid-state DC circuit breakers, hybrid DC circuit breakers, all-electric aircraft, high-speed railways, new energy vehicles, and power transmission systems. In these systems, IGBT power modules are usually faced with extremely harsh working conditions and there is a failure risk. Insulation degradation should be a cause for concern as a potential path of power module failure. In this paper, the discharge phenomena of the IGBT power module were observed based on Intensified Charge Coupled Devices (ICCD), and the triple junctions composed of copper–ceramic–silicone gel inside IGBT were found as the discharge points. Furthermore, the directed bonded copper (DBC) ceramic filled with silicone gel was used as a test sample to study the discharge failure process, including the partial discharge (PD), surface charges, and electric trees. The mechanism of discharge failure is discussed and analyzed. The insulation degradation process is accompanied by phenomena such as severe partial discharge and rapid electric tree growth. This research provides support for the analysis idea and guidance of the research method for the cause of power module failure.
逐年被引趋势
关键指标
同类平均 = 1
同领域 · 同年份 · 同类型
Google Scholar 与 OpenAlex 的被引统计范围不同,数值存在差异属正常。
AI 辅助阅读
依据:摘要
可就本文提问;依据不足时会说明。
学术脉络
学科主题
材料 / 化学High voltage insulation and dielectric phenomena
HVDC Systems and Fault Protection · Silicon Carbide Semiconductor Technologies
参考文献 22
此处列出前 3 条
引用本文 12
按被引量排序,此处列出前 3 条